The new multi-purpose sample stage, that fits the Empyrean and X’Pert Powder is easy to use and provides superior data quality. For existing users of PANalytical’s diffractometers, the SAXS capability is a straightforward addition to the instrument. On top of that, with the release of EasySAXS v2.0, a major new software version for SAXS analysis, PANalytical is helping to make nanoparticle analysis even easier.
Small-angle X-ray scattering (SAXS) is a versatile technique that is used for the structural characterization of solid and fluid materials in the range of 1-100 nanometers. It is applicable to crystalline and amorphous nanomaterials alike. Typical applications of SAXS comprise nanoparticle or pore size distribution determination, particle shape analysis and nanostructure analysis.
SAXS thus delivers complementary information to X-ray diffraction, also known as wide-angle X-ray scattering (XRD, WAXS), which is applied for qualitative and quantitative analysis of the crystalline phases that are present in a material. With the Empyrean and the X'Pert Powder instruments, PANalytical offers multi-purpose platforms that support the application of these and several other experimental techniques.
The new multi-purpose and factory pre-aligned SAXS sample stage removes the need for a user to align samples – they simply attach the stage and insert their prepared sample. Supplied with sample holders and preparation tools for liquids, powders, and thin solid objects, the stage also uses disposable quartz capillaries for liquid sample measurement. An adjustable precision SAXS anti-scatter slit attachment is available to extend the low-angle resolution limit, and a semi-transparent beamstop for fast low-angle diffraction measurements completes the hardware upgrades.
With EasySAXS v2.0 researchers can analyze liquid nanoparticles, dispersions, nanopowders, nanocomposites, and porous materials. The package features both automatic and GUI-based interactive modes. Automatic mode enables non-expert analysis of nanoparticle size distributions and specific surface areas using templates of predefined parameters. Results are summarized in automatically created reports. Major improvements have been made to the interactive mode covering primary data handling, Guinier and Porod analyses, determination of scattering invariant, model simulations, and fitting to particle size distribution and pair distribution function analyses. In addition, support for simulations and model fitting is included for basic geometrical bodies and can take account of the effects of size polydispersity, core-shell structures, and instrumental parameters.
For further information about these important upgrades, please contact a PANalytical sales representative. Contact details and further information are available at panalytical.com/.