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NI RF Power Amplifier Test Reference Solutions Meet New Test Challenges - Engineers testing wireless device power amplifiers (PAs) face increasing test challenges such as new wireless standards and evolving PA technologies - NI.com
NI RF Power Amplifier Test Reference Solutions Meet New Test Challenges

 

PRZOOM - /newswire/ - Austin, TX, United States, 2014/06/02 - Engineers testing wireless device power amplifiers (PAs) face increasing test challenges such as new wireless standards and evolving PA technologies - NI.com. NASDAQ: NATI

   
 
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Envelope tracking (ET) and digital predistortion (DPD) are popular techniques to improve PA efficiency and linearity but introduce test complexity. NI reference solutions simplify ET and DPD testing by combining PXI modular instruments with ready-to-run LabVIEW example code.

“We have been extremely impressed with the measurement speed of NI’s ET PA test solution and believe that it will be a tremendous asset to the industry,” said Jeremy Hendy, vice president of marketing at Nujira Ltd. “The step-change in complexity of today’s multimode, multiband 4G RF front ends mandates new approaches to design validation, with each design iteration needing many thousands of measurements to be made in the shortest possible time. We look forward to integrating NI PXI into our EasyET design flow in the future.”

The NI ET reference solution automates multiple modular instruments and offers tight synchronization between RF and baseband signal generators so engineers can more accurately characterize ET PAs. In addition, the NI DPD reference solution uses NI Vector Signal Transceiver technology to characterize raw PA behavior and apply standardized DPD models such as the memory polynomial model and memoryless lookup table. NI’s platform approach to RF test helps engineers to innovate faster by providing flexible and easily customizable tools.

“Using NI PXI and LabVIEW, we built a compact, portable, and reproducible test bench for characterizing, designing, and optimizing ET PAs with our GreenAmp-Lite™ technology in a fraction of the time it would have required previously,” said Johana Yan, Ph.D., MaXentric Technologies, LLC.

At IMS2014, NI (ni.com) is showcasing its industry-leading solutions for PA design and test. Live demonstrations will include ET and DPD testing, base station PA testing, microwave PA measurements, and more. Please visit us at booth 633.

 
 
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Agency / Source: National Instruments Corporation

 
 

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NI RF Power Amplifier Test Reference Solutions Meet New Test Challenges

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National Instruments | GreenAmp-Lite™ technology
Contact: Press Office - NI.com 
512-683-6215 pr[.]ni.com
 
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IMPORTANT INFORMATION: Issuance, publication or distribution of this press release in certain jurisdictions could be subject to restrictions. The recipient of this press release is responsible for using this press release and the information herein in accordance with the applicable rules and regulations in the particular jurisdiction. This press release does not constitute an offer or an offering to acquire or subscribe for any National Instruments Corporation securities in any jurisdiction including any other companies listed or named in this release.

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