At the Denver X-ray Conference (5-9th August 2013) PANalytical showcases results from its new lab-based GISAXS option on the Empyrean multipurpose XRD platform.
GISAXS (Grazing incidence small-angle X-ray scattering) is a surface sensitive method for investigating nanostructure in thin films. GISAXS data provide information about nanostructure dimensions, distributions and structural ordering in thin films. Thin film nanomaterials are an active research area in energy technologies, photovoltaic materials, semiconductor devices, photonics, acoustics and catalysis, to name a few.
GISAXS was once considered a method exclusive to synchrotron beam lines, and made its way towards dedicated laboratory instruments. Now the Medipix2 detector with photon-counting technology enables PANalytical’s PIXcel3D area detector to collect noise-free images, making good use of lab source intensities to obtain high quality images on a multi-purpose diffractometer. With two dimensional collimation of the incident X-ray beam, the new GISAXS option offers true 2D GISAXS measurement. Furthermore, at 55 microns, the uniquely small pixel size of the detector enables 2D GISAXS data with excellent sharpness to be obtained on a standard radius XRD system.
GISAXS on the Empyrean is accessible and user-friendly. The addition of the new GISAXS option on this multi-purpose instrument is both cost-effective and convenient.
In 2002, PANalytical (panalytical.com) was incorporated into Spectris plc as one of its autonomous operating businesses.
Spectris plc (spectris.com) is a leading supplier of productivity-enhancing instrumentation and controls. The company’s products and technologies help customers to improve product quality and performance, improve core manufacturing processes, reduce downtime and wastage and reduce time to market. Its global customer base spans a diverse range of end user markets.