PRZOOM - /newswire/ -
Barcelona, Spain, 2012/02/21 - February 27 through March 1 - Mobile World Congress, Barcelona, Spain – Hall 2.0, Booth 2B93 - NI.com. NASDAQ: NATI
Who: David Loadman, vice president of mobile device test at National Instruments, with NI test product engineers
What: Demonstrations include the following PXI test systems:
• Mobile device validation and production test system for cellular and wireless connectivity for LTE, WCDMA, GSM/EDGE, Bluetooth and WLAN;
• Test solution for 802.11ac chipsets and devices with both Rx and Tx configurations up to 4x4 MIMO including support for 80 MHz and 80+80 MHz (160 MHz);
• Multi-DUT parallel production test solution for mobile handsets demonstrating parallel testing of HDMI video and GPS.
When: February 27 through March 1, 2012
Where: Mobile World Congress, Barcelona, Spain – Hall 2.0, Booth 2B93
Why: Engineers can achieve 5-10X faster test times with NI software-defined PXI test solutions than with traditional rack-and-stack box instruments. These systems are based on multicore processors, field-programmable gate arrays (FPGAs) and high-speed data buses, which provide field upgradability, faster processing, higher bandwidth and scalable support for new cellular and wireless connectivity standards.
About National Instruments
Since 1976, National Instruments (ni.com) has equipped engineers and scientists with tools that accelerate productivity, innovation and discovery. NI’s graphical system design approach to engineering provides an integrated software and hardware platform that speeds the development of any system needing measurement and control. The company’s long-term vision and focus on improving society through its technology supports the success of its customers, employees, suppliers and shareholders.